We exhibit an explicitly computable ‘pseudorandom’ generator stretching l bits into m(l) = lΩ(log l) bits that look random to constant-depth circuits of size m(l) with log m...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Locally testable codes, i.e., codes where membership in the code is testable with a constant number of queries, have played a central role in complexity theory. It is well known t...
Eli Ben-Sasson, Ghid Maatouk, Amir Shpilka, Madhu ...
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...
Adaptive representations allow evolution to explore the space of phenotypes by choosing the most suitable set of genotypic parameters. Although such an approach is believed to be ...