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COCO
2005
Springer
130views Algorithms» more  COCO 2005»
13 years 11 months ago
Pseudorandom Bits for Constant Depth Circuits with Few Arbitrary Symmetric Gates
We exhibit an explicitly computable ‘pseudorandom’ generator stretching l bits into m(l) = lΩ(log l) bits that look random to constant-depth circuits of size m(l) with log m...
Emanuele Viola
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
13 years 9 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
ECCC
2010
83views more  ECCC 2010»
13 years 6 months ago
Symmetric LDPC codes are not necessarily locally testable
Locally testable codes, i.e., codes where membership in the code is testable with a constant number of queries, have played a central role in complexity theory. It is well known t...
Eli Ben-Sasson, Ghid Maatouk, Amir Shpilka, Madhu ...
ISCA
2012
IEEE
281views Hardware» more  ISCA 2012»
11 years 11 months ago
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...
GECCO
2007
Springer
172views Optimization» more  GECCO 2007»
14 years 3 months ago
Acquiring evolvability through adaptive representations
Adaptive representations allow evolution to explore the space of phenotypes by choosing the most suitable set of genotypic parameters. Although such an approach is believed to be ...
Joseph Reisinger, Risto Miikkulainen