Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
In bandit problems, a decision-maker must choose between a set of alternatives, each of which has a fixed but unknown rate of reward, to maximize their total number of rewards ov...
Michael D. Lee, Shunan Zhang, Miles Munro, Mark St...
This paper builds a new theoretical connection between singular control of finite variation and optimal switching problems. This correspondence provides a novel method for solving ...
In this paper, we develop a unified theory in analyzing optimal switch box design problems, particularly for the unsolved irregular cases, where different pin counts are allowed on...
This paper presents a new solution approach to the optimal control problem of fixed frequency switch-mode DC-DC converters using hybrid systems methodologies. In particular, the n...