In this paper we consider the problem of monitoring an art gallery modeled as a polygon, the edges of which are arcs of curves. We consider two types of guards: edge guards (these...
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
Abstract—In two recent contributions [1], [2], we have provided a comparative analysis of various optimization algorithms, which can be used for atomic location estimation, and s...
Stefano Tennina, Marco Di Renzo, Fabio Graziosi, F...
Abstract. This paper presents parallel approaches to the complete transient numerical analysis of stochastic reward nets (SRNs) for both shared and distributed-memory machines. Par...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...