Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
We report an innovative solely optical architecture to implement the centralized wavelength conversion module of the CWC (Controlled Wavelength Conversion) protocol [1]. The propo...
Georgios I. Papadimitriou, Amalia N. Miliou, Andre...
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microprocessors. Thus, the designer can evaluate if a particular block is working bey...