9 search results - page 2 / 2 » On undetectable faults in partial scan circuits |
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
IAJIT
2010
13 years 6 months ago
2010
: A test procedure for testing mainly the boundary scan cells, and testing partially the test access port controller in programmable logic devices, and field programmable gate arra...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...