229 search results - page 16 / 46 » On-Chip Test Generation Using Linear Subspaces |
ICBA
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. Current appearance-based face recognition system encounters the difficulty to recognize faces with appearance variations, while only a small number of training images are...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
FLAIRS
2004
13 years 9 months ago
2004
The Heavy Weight Deflectometer (HWD) test is one of the most widely used tests for assessing the structural integrity of airport pavements in a non-destructive manner. The elastic...
ASIACRYPT
1999
Springer
13 years 12 months ago
1999
Springer
Abstract. Beth and Dai studied in their Eurocrypt paper [1] the relationship between linear complexity (that is, the length of the shortest Linear Feedback Shift Register that gene...
KDD
2001
ACM
14 years 8 months ago
2001
ACM
In this paper we present a method for clustering SAGE (Serial Analysis of Gene Expression) data to detect similarities and dissimilarities between different types of cancer on the...