229 search results - page 20 / 46 » On-Chip Test Generation Using Linear Subspaces |
JSW
2007
13 years 7 months ago
2007
—Higher-order black box software tests against independent end user domain requirements has become an issue of increasing importance with compositional reuse of software artifact...
METRICS
2003
IEEE
14 years 28 days ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
JEI
2002
13 years 7 months ago
2002
This paper describes a database collecting natural color images, called the Natural Image Database, and shows how it is used for illuminant estimation problems. First, we present ...
ASYNC
2006
IEEE
14 years 1 months ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
ISCAS
2003
IEEE
14 years 28 days ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...