229 search results - page 23 / 46 » On-Chip Test Generation Using Linear Subspaces |
SIGIR
2005
ACM
14 years 1 months ago
2005
ACM
This paper presents a new discriminative model for information retrieval (IR), referred to as linear discriminant model (LDM), which provides a flexible framework to incorporate a...
HIS
2001
13 years 9 months ago
2001
Abstract. Linear Discriminant (LD) techniques are typically used in pattern recognition tasks when there are many (n >> 104 ) datapoints in low-dimensional (d < 102 ) spac...
FCCM
2003
IEEE
14 years 29 days ago
2003
IEEE
Hardware simulation of channel codes offers the potential of improving code evaluation speed by orders of magnitude over workstation- or PC-based simulation. We describe a hardwar...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
POPL
2009
ACM
14 years 8 months ago
2009
ACM
c Modular Abstractions for Linear Constraints David Monniaux VERIMAG June 27, 2008 se a method for automatically generating abstract transformers for static by abstract interpreta...