229 search results - page 32 / 46 » On-Chip Test Generation Using Linear Subspaces |
EMSOFT
2009
Springer
14 years 2 months ago
2009
Springer
The major obstacle to use multicores for real-time applications is that we may not predict and provide any guarantee on real-time properties of embedded software on such platforms...
ICASSP
2009
IEEE
14 years 2 months ago
2009
IEEE
In this paper we propose a new technique for robust keyword spotting that uses bidirectional Long Short-Term Memory (BLSTM) recurrent neural nets to incorporate contextual informa...
SPIN
2000
Springer
13 years 11 months ago
2000
Springer
The Temporal Rover is a specification based verification tool for applications written in C, C++, Java, Verilog and VHDL. The tool combines formal specification, using Linear-Time ...
JMLR
2008
13 years 7 months ago
2008
Pointwise consistent, feasible procedures for estimating contemporaneous linear causal structure from time series data have been developed using multiple conditional independence ...
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...