229 search results - page 9 / 46 » On-Chip Test Generation Using Linear Subspaces |
CVPR
2008
IEEE
14 years 9 months ago
2008
IEEE
We examine the problem of segmenting tracked feature point trajectories of multiple moving objects in an image sequence. Using the affine camera model, this motion segmentation pr...
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Classifier fusion strategies have shown great potential to enhance the performance of pattern recognition systems. There is an agreement among researchers in classifier combination...
FGR
2008
IEEE
14 years 2 months ago
2008
IEEE
An image-set based face recognition algorithm is proposed that exploits the full geometrical interpretation of Canonical Correlation Analysis (CCA). CCA maximizes the correlation ...
CIVR
2006
Springer
13 years 11 months ago
2006
Springer
The problem of face detection remains challenging because faces are non-rigid objects that have a high degree of variability with respect to head rotation, illumination, facial exp...
DATE
1997
IEEE
13 years 12 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...