Current hard real-time technologies are unable to support a new class of applications that have real-time constraints but with dynamic request arrivals and unpredictable resource r...
Design combinatorial theory for test-case generation has been used successfully in the past. It is useful in optimizing test cases as it is practically impossible to exhaustively t...
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Power, energy, and thermal concerns have constrained embedded systems designs. Computing capability and storage density have increased dramatically, enabling the emergence of hand...
Adaptive Random Testing subsumes a class of algorithms that detect the first failure with less test cases than Random Testing. The present paper shows that a "reference metho...