143 search results - page 4 / 29 » Optimizing inspection strategies for multi-stage manufacturi... |
WSC
2008
13 years 9 months ago
2008
MKPLS (Multiway Kernel Partial Least Squares) methods are used to model the batch processes from process operational data. To improve the optimization performance, a batch-to-batc...
ICRA
2000
IEEE
13 years 11 months ago
2000
IEEE
The need to register data is abundant in applications such as: world modeling, part inspection and manufacturing, object recognition, pose estimation, robotic navigation, and reve...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
ATS
2005
IEEE
14 years 29 days ago
2005
IEEE
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
WSC
2000
13 years 8 months ago
2000
A graphical discrete event simulation library is proposed for system simulation that is based on interacting concurrent processes. This library works with EXTEND (Imagine That Inc...