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» PEDS: A Parallel Error Detection Scheme for TCAM Devices
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INFOCOM
2009
IEEE
14 years 5 months ago
PEDS: A Parallel Error Detection Scheme for TCAM Devices
Anat Bremler-Barr, David Hay, Danny Hendler, Ron M...
ISCA
2012
IEEE
281views Hardware» more  ISCA 2012»
12 years 1 months ago
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...