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PEDS: A Parallel Error Detection Scheme for TCAM Devices
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INFOCOM
2009
IEEE
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PEDS: A Parallel Error Detection Scheme for TCAM Devices
15 years 9 months ago
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Anat Bremler-Barr, David Hay, Danny Hendler, Ron M...
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ISCA
2012
IEEE
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LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
13 years 5 months ago
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Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...
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