650 search results - page 17 / 130 » Packaging experiences for improving testing technique select... |
IJCAI
1989
14 years 7 hour ago
1989
This paper presents an evaluation of two orthogonal schemes for improving the efficiency of solving constraint satisfaction problems (CSPs). The first scheme involves a class of p...
IPPS
2009
IEEE
14 years 5 months ago
2009
IEEE
In this paper we use Dijkstra’s algorithm as a challenging, hard to parallelize paradigm to test the efficacy of several parallelization techniques in a multicore architecture....
MCS
2004
Springer
14 years 4 months ago
2004
Springer
We experimentally evaluate bagging and six other randomization-based approaches to creating an ensemble of decision-tree classifiers. Bagging uses randomization to create multipl...
DATE
2007
IEEE
14 years 5 months ago
2007
IEEE
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
CLEF
2010
Springer
13 years 12 months ago
2010
Springer
In the context of the CLEF-IP 2010 classification task, we conducted a series of experiments with the Linguistic Classification System (LCS). We compared ment representations for p...