34 search results - page 1 / 7 » Parallel fault backtracing for calculation of fault coverage |
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
TASE
2009
IEEE
14 years 3 months ago
2009
IEEE
Testing is inherently incomplete; no test suite will ever be able to test all possible usage scenarios of a system. It is therefore vital to assess the implication of a system pas...
DSN
2007
IEEE
14 years 3 months ago
2007
IEEE
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
IPPS
2006
IEEE
14 years 2 months ago
2006
IEEE
After having drawn up a state of the art on the theoretical feasibility of a system of periodic tasks scheduled by a preemptive algorithm at fixed priorities, we show in this art...
TVLSI
2002
13 years 8 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...