34 search results - page 4 / 7 » Parallel fault backtracing for calculation of fault coverage |
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
EGC
2005
Springer
14 years 2 months ago
2005
Springer
In this paper we study a fault tolerant model for Grid environments based on the task replication concept. The basic idea is to produce and submit to the Grid multiple replicas of ...
VTS
1997
IEEE
14 years 25 days ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
DSN
2000
IEEE
14 years 1 months ago
2000
IEEE
We describe and test a software approach to overcoming radiation-induced errors in spaceborne applications running on commercial off-the-shelf components. The approach uses checks...
ICPADS
2000
IEEE
14 years 6 days ago
2000
IEEE
1 Reliable communication in cube-based multicomputers using the extended safety vector concept is studied in this paper. In our approach, each node in a cube-based multicomputer o...