758 search results - page 42 / 152 » Pattern-Constrained Test Case Generation |
145
Voted
KBSE
2005
IEEE
15 years 8 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
130
click to vote
VLSID
2007
IEEE
16 years 2 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
109
Voted
SIGSOFT
2003
ACM
16 years 3 months ago
2003
ACM
Although graphical user interfaces (GUIs) constitute a large part of the software being developed today and are typically created using rapid prototyping, there are no effective r...
116
click to vote
ICASSP
2011
IEEE
14 years 6 months ago
2011
IEEE
In this work we concentrate on generating compound words with high order n-gram information for speech recognition. In most existing compound words generation methods, only bi-gra...
112
click to vote
ENTCS
2007
15 years 2 months ago
2007
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...