758 search results - page 49 / 152 » Pattern-Constrained Test Case Generation |
210
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SIGMOD
2006
ACM
16 years 2 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...
136
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SIGSOFT
2003
ACM
15 years 7 months ago
2003
ACM
This paper presents PLUTO, a simple and intuitive methodology to manage the testing process of product lines, described as Product Lines Use Cases (PLUCs). PLUCs are an extension ...
129
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JSS
2008
15 years 1 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
133
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IOLTS
2000
IEEE
15 years 7 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
118
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DLOG
2009
15 years 10 days ago
2009
Abstract. GridTest is a framework for testing automated theorem provers using randomly generated formulas. It can be used to run tests locally, in a single computer, or in a comput...