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128
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TCAD
2008
15 years 2 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
126
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ICDM
2006
IEEE
15 years 8 months ago
2006
IEEE
There has been a lot of recent interest in mining patterns from graphs. Often, the exact structure of the patterns of interest is not known. This happens, for example, when molecu...
123
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TVCG
2008
15 years 2 months ago
2008
Abstract-- This paper introduces orthogonal vector field visualization on 2D manifolds: a representation by lines that are perpendicular to the input vector field. Line patterns ar...
109
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SAC
2010
ACM
15 years 9 months ago
2010
ACM
Implementing the 23 Gang-of-Four design patterns in the aspectoriented programming language Object Teams/Java (OT/J) yields modularity and reusability results roughly comparable t...
120
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ICAC
2009
IEEE
15 years 9 months ago
2009
IEEE
Dynamic adaptation may be used to prevent software downtime while new requirements and responses to environmental conditions are incorporated into the system. Previously, we studi...