This article aims at making iterative optimization practical and usable by speeding up the evaluation of a large range of optimizations. Instead of using a full run to evaluate a s...
Grigori Fursin, Albert Cohen, Michael F. P. O'Boyl...
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
1 Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In particular, safety-critical computer-based applications are hitting ...
Maurizio Rebaudengo, Matteo Sonza Reorda, Marco To...
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...