301 search results - page 15 / 61 » Physical design techniques for optimizing RTA-induced variat... |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
Process variations due to lens aberrations are to a large extent systematic, and can be modeled for purposes of analyses and optimizations in the design phase. Traditionally, vari...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
In this paper, we propose the first wire density driven global routing that considers CMP variation and timing. To enable CMP awareness during global routing, we propose a compac...
ISLPED
2007
ACM
13 years 10 months ago
2007
ACM
We present a novel detailed placement technique that accounts for systematic through-pitch variations to reduce leakage. Leakage depends nearly exponentially on linewidth (gate le...
ASPDAC
2009
ACM
14 years 3 months ago
2009
ACM
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
DEXA
2000
Springer
14 years 23 days ago
2000
Springer
Abstract. Bitmap indices are popular multi-dimensional data structures for accessing read-mostly data such as data warehouse (DW) applications, decision support systems (DSS) and o...