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TCAD
2008
114views more  TCAD 2008»
13 years 8 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
SSPR
2010
Springer
13 years 6 months ago
Non-parametric Mixture Models for Clustering
Mixture models have been widely used for data clustering. However, commonly used mixture models are generally of a parametric form (e.g., mixture of Gaussian distributions or GMM),...
Pavan Kumar Mallapragada, Rong Jin, Anil K. Jain
CVPR
2003
IEEE
14 years 10 months ago
Activity Recognition Using the Dynamics of the Configuration of Interacting Objects
Monitoring activities using video data is an important surveillance problem. A special scenario is to learn the pattern of normal activities and detect abnormal events from a very...
Namrata Vaswani, Amit K. Roy Chowdhury, Rama Chell...