3819 search results - page 32 / 764 » Predicting Dependability by Testing |
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
SRDS
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents our research on devising a dependability assessment method for the upcoming OGSA 3.0 middleware using network level fault injection. We compare existing DCE mi...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
TIS (Test Instruction Set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replace...
QSIC
2008
IEEE
14 years 2 months ago
2008
IEEE
In the context of open source development or software evolution, developers are often faced with test suites which have been developed with no apparent rationale and which may nee...
FEDCSIS
2011
12 years 7 months ago
2011
Abstract—The Future Internet will be a complex interconnection of services, applications, content and media, on which our society will become increasingly dependent. Time to mark...