158 search results - page 2 / 32 » Predicting defects with program dependencies |
ECOOP
2005
Springer
14 years 1 months ago
2005
Springer
A common method to localize defects is to compare the coverage of passing and failing program runs: A method executed only in failing runs, for instance, is likely to point to the ...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
Intuition suggests that random testing of object-oriented programs should exhibit a high difference in the number of defects detected by two different runs over the same amount of...
WCRE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Change coupling is the implicit relationship between two or more software artifacts that have been observed to frequently change together during the evolution of a softw...
ETFA
2008
IEEE
13 years 9 months ago
2008
IEEE
Microshrinkages are known as probably the most difficult defects to avoid in high-precission foundry. Depending on the magnitude of this defect, the piece in which it appears must...
ISSRE
2002
IEEE
14 years 14 days ago
2002
IEEE
In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a furt...