129 search results - page 3 / 26 » Process Variations and their Impact on Circuit Operation |
TVLSI
2010
13 years 2 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
ATS
2003
IEEE
14 years 19 days ago
2003
IEEE
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
Current lithography techniques use a light wavelength of 193nm to print sub-65nm features. This introduces process variations which cause mismatches between desired and actual waf...
DAC
2012
ACM
11 years 9 months ago
2012
ACM
Near-threshold operation has emerged as a competitive approach for energy-efficient architecture design. In particular, a combination of near-threshold circuit techniques and par...
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
— Designers require variational information for robust designs. Characterization of such information can be costly for the novel nanoparticle interconnect process, which utilize ...