137 search results - page 11 / 28 » Process variation dimension reduction based on SVD |
GLVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...
TVLSI
2008
13 years 7 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
CIKM
2008
Springer
13 years 10 months ago
2008
Springer
Random projection (RP) is a common technique for dimensionality reduction under L2 norm for which many significant space embedding results have been demonstrated. However, many si...
ICIP
2003
IEEE
14 years 9 months ago
2003
IEEE
Using a novel data dimension reduction method proposed in statistics, we develop an appearance-based face recognition algorithm which is insensitive to large variation in lighting...
ICIAR
2004
Springer
14 years 1 months ago
2004
Springer
We present an information theoretic approach for learning a linear dimension reduction transform for object classification. The theoretic guidance of the approach is that the trans...