1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Disproof can be as important as proof in studying programs and programming languages. In particular, side conditions in a statement about program behavior are sometimes best unders...
Roberts’ theorem from 1979 states that the only incentive compatible mechanisms over a full domain and range of at least 3 are weighted variants of the VCG mechanism termed affin...