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DFT
2006
IEEE
14 years 4 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
ICST
2009
IEEE
14 years 5 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
KDD
2000
ACM
14 years 2 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
FLOPS
2010
Springer
14 years 5 months ago
2010
Springer
Disproof can be as important as proof in studying programs and programming languages. In particular, side conditions in a statement about program behavior are sometimes best unders...
SAGT
2009
Springer
14 years 5 months ago
2009
Springer
Roberts’ theorem from 1979 states that the only incentive compatible mechanisms over a full domain and range of at least 3 are weighted variants of the VCG mechanism termed affin...