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COMPSAC
2007
IEEE
14 years 2 months ago
AOP-based automated unit test classification of large benchmarks
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
Cyrille Artho, Zhongwei Chen, Shinichi Honiden
ITC
1991
IEEE
80views Hardware» more  ITC 1991»
14 years 1 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
ET
2002
72views more  ET 2002»
13 years 10 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba
FATES
2003
Springer
14 years 3 months ago
Mutually Enhancing Test Generation and Specification Inference
Generating effective tests and inferring likely program specifications are both difficult and costly problems. We propose an approach in which we can mutually enhance the tests and...
Tao Xie, David Notkin
ICSE
2007
IEEE-ACM
14 years 10 months ago
Regression Test Selection for AspectJ Software
As aspect-oriented software development gains popularity, there is growing interest in using aspects to implement cross-cutting concerns in object-oriented systems. When aspect-or...
Guoqing Xu, Atanas Rountev