— Scaling down the voltage levels of the processing elements (PEs) in a Network-on-Chip (NoC) can significantly reduce the computation energy consumption with an overhead of the...
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
Abstract— The inherent nature of the physical setup and transmission mechanism in wireless ad hoc networks with random channel access, results in correlation between the link met...
Arzad Alam Kherani, Dinesh Kumar 0002, Eitan Altma...
Abstract. This paper describes a new approach for parameter optimization that uses a novel representation for the parameters to be optimized. By using genetic programming, the new ...
With the discovery of new exploit techniques, new protection mechanisms are needed as well. Mitigations like DEP (Data Execution Prevention) or ASLR (Address Space Layout Randomiz...