405 search results - page 20 / 81 » Random Number Selection in Self-assembly |
INFOCOM
2007
IEEE
14 years 1 months ago
2007
IEEE
— We propose new algorithms to achieve k-coverage in dense sensor networks. In such networks, covering sensor locations approximates covering the whole area. However, it has been...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ENTCS
2002
13 years 7 months ago
2002
The difficulty of finding errors caused by unexpected interleavings of threads in concurrent programs is well known. Model checkers can pinpoint such errors and verify correctness...
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Intuition is often not a good guide to know which testing strategies will work best. There is no substitute for experimental analysis based on objective criteria: how many bugs a ...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— A novel, simple and efficient method for the generation of Tikhonov (a.k.a. von Mises) random variates is proposed. In the proposed method, circular variates of a pres...