168 search results - page 18 / 34 » Random testing of interrupt-driven software |
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
FATES
2004
Springer
14 years 24 days ago
2004
Springer
We present the development of T-UPPAAL — a new tool for online black-box testing of real-time embedded systems from non-deterministic timed automata specifications. It is based ...
SIAMAM
2011
13 years 2 months ago
2011
We consider the problem of locating perfectly conducting cracks and estimating their geometric features from multi-static response matrix measurements at a single or multiple frequ...
VMCAI
2009
Springer
14 years 2 months ago
2009
Springer
This paper describes the methods used in Empire, a tool to detect concurrency-related bugs, namely atomic-set serializability violations in Java programs. The correctness criterion...
SEFM
2006
IEEE
14 years 1 months ago
2006
IEEE
We present an operational model for describing random reactive systems. Some models have already been proposed for this purpose, but they generally aim at performing global reason...