We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
The latent topic model plays an important role in the unsupervised learning from a corpus, which provides a probabilistic interpretation of the corpus in terms of the latent topic...
We present an approach to low-level vision that combines two main ideas: the use of convolutional networks as an image processing architecture and an unsupervised learning procedu...