466 search results - page 32 / 94 » Reduce, reuse |
ICRA
2007
IEEE
14 years 1 months ago
2007
IEEE
— Quickly adapting the manufacturing system to the production of new or modified products is critical for manufacturers in order to stay competitive. For flexible manufacturing...
ICCD
2000
IEEE
14 years 4 months ago
2000
IEEE
This paper presents a new method to extract functionally equivalent structures from logic netlists. It uses a fast functional regularity extraction algorithm based on structural e...
VTC
2008
IEEE
14 years 1 months ago
2008
IEEE
—In this paper, we investigate the performance of adaptive beamforming while using subcarrier permutation PUSC in WiMAX cellular network. In the literature, it has been shown tha...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
Regression testing aims at showing that code has not been adversely affected by modification activities during maintenance. Regression test selection techniques reuse tests from...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...