- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/relia...
The logistic regression model is used to predict a binary response variable in terms of a set of explicative ones. The estimation of the model parameters is not too accurate and t...
Ana M. Aguilera, Manuel Escabias, Mariano J. Valde...
In this paper, we address the peak detection and alignment problem in the analysis of mass spectrometry data. To deal with the peak redundancy problem existing in the MALDI data a...
Weichuan Yu, Baolin Wu, Ning Lin, Kathy Stone, Ken...
Abstract— In this paper we consider several problems involving control with limited actuation and sampling rates. Event-based control has emerged as an attractive approach for ad...
Abstract. Dependency injection is a hot topic among industrial developers using component frameworks. This paper first mentions that dependency injection and aspect-oriented progr...