387 search results - page 15 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
ISQED
2000
IEEE
13 years 12 months ago
2000
IEEE
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
SERA
2005
Springer
14 years 1 months ago
2005
Springer
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...
ISSRE
2002
IEEE
14 years 14 days ago
2002
IEEE
Formal analysis of software is a powerful analysis tool, but can be too costly. Random search of formal models can reduce that cost, but is theoretically incomplete. However, rand...
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...