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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
14 years 5 days ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
TNN
2008
105views more  TNN 2008»
13 years 8 months ago
Incremental Learning of Chunk Data for Online Pattern Classification Systems
This paper presents a pattern classification system in which feature extraction and classifier learning are simultaneously carried out not only online but also in one pass where tr...
Seiichi Ozawa, Shaoning Pang, Nikola K. Kasabov
JNS
2010
89views more  JNS 2010»
13 years 2 months ago
The Pattern of Multiple Rings from Morphogenesis in Development
Under certain conditions the problem of morphogenesis in development and the problem of morphology in block copolymers may be reduced to one geometric problem. In two dimensions t...
Xiaosong Kang, Xiaofeng Ren
CPM
1995
Springer
139views Combinatorics» more  CPM 1995»
13 years 11 months ago
Pattern-Matching for Strings with Short Descriptions
We consider strings which are succinctly described. The description is in terms of straight-line programs in which the constants are symbols and the only operation is the concaten...
Marek Karpinski, Wojciech Rytter, Ayumi Shinohara
IJCNN
2006
IEEE
14 years 2 months ago
Reconstruction of Gene Regulatory Networks from Temporal Microarray Data Using Pattern Recognition Techniques
- Gene regulatory networks allow us to study and understand genes’ roles in biological processes. Among others, regulatory networks help to identify pathway initiator genes and t...
Azhar Salim, Faramarz Valafar