117 search results - page 4 / 24 » Redundancy Based Test-Suite Reduction |
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely fau...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
Test suite reduction uses test requirement coverage to determine if the reduced test suite maintains the original suite’s requirement coverage. Based on observations from our pr...
ASWEC
2007
IEEE
13 years 11 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
AICT
2008
IEEE
13 years 7 months ago
2008
IEEE
This paper presents the simplified method of random test suite based on the frequency (block) test. The test is used to check the first property of random numbers which is to have ...
ICSE
2009
IEEE-ACM
14 years 2 months ago
2009
IEEE-ACM
Regression test suites tend to grow over time as new test cases are added to exercise new functionality or to target newly-discovered faults. When test suites become too large, th...