1071 search results - page 188 / 215 » Regression from patch-kernel |
VTS
2000
IEEE
14 years 2 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
BMCBI
2010
13 years 10 months ago
2010
Background: This paper introduces the notion of optimizing different norms in the dual problem of support vector machines with multiple kernels. The selection of norms yields diff...
CVPR
2004
IEEE
14 years 12 months ago
2004
IEEE
Recognition difficulty is statistically linked to ??? subject covariate factors such as age and gender for three face recognition algorithms: principle components analysis, an int...
CVPR
2005
IEEE
14 years 12 months ago
2005
IEEE
In this paper we focus on high dimensional data sets for which the number of dimensions is an order of magnitude higher than the number of objects. From a classifier design standp...
CVPR
2007
IEEE
14 years 12 months ago
2007
IEEE
The goal of this paper is to find sparse and representative spatial priors that can be applied to part-based object localization. Assuming a GMRF prior over part configurations, w...