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» Reliability estimation of a statistical classifier
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ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
14 years 5 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
ETVC
2008
13 years 10 months ago
Statistical Computing on Manifolds: From Riemannian Geometry to Computational Anatomy
Computational anatomy is an emerging discipline that aims at analyzing and modeling the individual anatomy of organs and their biological variability across a population. The goal ...
Xavier Pennec
ICPR
2006
IEEE
14 years 9 months ago
Statistical Model for the Classification of the Wavelet Transforms of T-ray Pulses
This study applies Auto Regressive (AR) and Auto Regressive Moving Average (ARMA) modeling to wavelet decomposed terahertz pulsed signals to assist biomedical diagnosis and mail/p...
Bradley Ferguson, Brian Wai-Him Ng, Derek Abbott, ...
JMLR
2002
90views more  JMLR 2002»
13 years 8 months ago
Machine Learning with Data Dependent Hypothesis Classes
We extend the VC theory of statistical learning to data dependent spaces of classifiers. This theory can be viewed as a decomposition of classifier design into two components; the...
Adam Cannon, J. Mark Ettinger, Don R. Hush, Clint ...
MICCAI
2010
Springer
13 years 6 months ago
Tract-Based Probability Densities of Diffusivity Measures in DT-MRI
We evaluate probability density functions of diffusivity measures in DTI fiber tracts as biomarkers. For this, we estimate univariate and bivariate densities, such as joint probabi...
Çagatay Demiralp, David H. Laidlaw