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TOOLS
1998
IEEE
13 years 11 months ago
1998
IEEE
Since the publication of the Design Patterns book, a large number of design patterns have been identified and codified. Unfortunately, these patterns are mostly organised in an ad...
Publication
In recent years, with camera pixels shrinking in size, images are more likely to include defocused regions. In order to recover scene details from defocused regions, deblurring tec...
CHI
2005
ACM
14 years 7 months ago
2005
ACM
As part of a comparative ethnographic study of everyday life of young professionals in London, Los Angeles, and Tokyo, we conducted a detailed survey of wallets and their contents...
OOPSLA
1997
Springer
13 years 11 months ago
1997
Springer
ed Abstract Factory is yet another. When patterns cooperate, the cooperation itself can give rise to problems, contexts, trade-offs, and consequences. For instance, should a Visito...
MTDT
2003
IEEE
14 years 23 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...