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ITC
1997
IEEE
92views Hardware» more  ITC 1997»
14 years 1 months ago
A Novel Functional Test Generation Method for Processors Using Commercial ATPG
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham
CORR
2011
Springer
140views Education» more  CORR 2011»
13 years 3 months ago
Sampling-rate-aware noise generation
In this paper we consider the generation of discrete white noise. Despite this seems to be a simple problem, common noise generator implementations do not deliver comparable resul...
Henning Thielemann
IJOE
2007
107views more  IJOE 2007»
13 years 8 months ago
Learning Digital Test and Diagnostics via Internet
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
Raimund Ubar, Artur Jutman, Margus Kruus, Elmet Or...
EUC
2005
Springer
14 years 2 months ago
Dynamic Resource Discovery for Sensor Networks
As sensor networks mature the current generation of sensor networks that are application-specific and exposed only to a limited set of users will give way to heterogeneous sensor ...
Sameer Tilak, Kenneth Chiu, Nael B. Abu-Ghazaleh, ...
SMA
1999
ACM
106views Solid Modeling» more  SMA 1999»
14 years 1 months ago
Resolving non-uniqueness in design feature histories
Nearly all major commercial computer-aided design systems have adopted a feature-based design approach to solid modeling. Models are created via a sequence of operations which app...
Vincent A. Cicirello, William C. Regli