Fault tolerant measurements are an essential requirement for system identification, control and protection. Measurements can be corrupted or interrupted due to sensor failure, bro...
Wei Qiao, Zhi Gao, Ronald G. Harley, Ganesh K. Ven...
Inner holes, artifacts and blank spots are common in microarray images, but current image analysis methods do not pay them enough attention. We propose a new robust model-based me...
Qunhua Li, Chris Fraley, Roger Eugene Bumgarner, K...
The recent emergence of web mash-ups and open source software is driving the development of new practices in software and systems development. In this paper we explore novel pract...
Ingbert R. Floyd, M. Cameron Jones, Dinesh Rathi, ...
Software developers have long known that project success requires a robust understanding of both technical and social linkages. However, research has largely considered these inde...
Anita Sarma, Larry Maccherone, Patrick Wagstrom, J...
Converting a scanned document to a binary format (black and white) is a key step in the digitization process. While many existing binarization algorithms operate robustly for well...