We consider the problem of approximating the 3D scan of a real object through an affine combination of examples. Common approaches depend either on the explicit estimation of poi...
Classifying images using features extracted from densely sampled local patches has enjoyed significant success in many detection and recognition tasks. It is also well known that ...
In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
The recent upsurge of research toward compressive sampling and parsimonious signal representations hinges on signals being sparse, either naturally, or, after projecting them on a...
Georgios B. Giannakis, Gonzalo Mateos, Shahrokh Fa...
Exploiting spectral properties of symmetric banded Toeplitz matrices, we describe simple sufficient conditions for positivity of a trigonometric polynomial formulated as linear ma...