Metric and kernel learning arise in several machine learning applications. However, most existing metric learning algorithms are limited to learning metrics over low-dimensional d...
Prateek Jain, Brian Kulis, Jason V. Davis, Inderji...
Background: Feature selection is a pattern recognition approach to choose important variables according to some criteria in order to distinguish or explain certain phenomena (i.e....
Abstract. Concurrent trace programs (CTPs) are slices of the concurrent programs that generate the concrete program execution traces, where inter-thread event order specific to th...
In this paper we propose a new wavelet transform applicable to functions defined on graphs, high dimensional data and networks. The proposed method generalizes the Haar-like transf...
Cryptographic applications using an elliptic curve over a finite field filter curves for suitability using their order as the primary criterion: e.g. checking that their order has...
David Jao, Stephen D. Miller, Ramarathnam Venkates...