In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
A method is given for constructing a max register, a linearizable, wait-free concurrent data structure that supports a write operation and a read operation that returns the larges...
In emerging applications such as location-based services, sensor monitoring and biological management systems, the values of the database items are naturally imprecise. For these ...
Reynold Cheng, Lei Chen 0002, Jinchuan Chen, Xike ...
Any proof of P = NP will have to overcome two barriers: relativization and natural proofs. Yet over the last decade, we have seen circuit lower bounds (for example, that PP does n...
Abstract—The capacity of multiuser networks has been a longstanding problem in information theory. Recently, Avestimehr et al. have proposed a deterministic network model to appr...
MinJi Kim, Elona Erez, Edmund M. Yeh, Muriel M&eac...