334 search results - page 55 / 67 » Scalable complex pattern search in sequential data |
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
KDD
1995
ACM
13 years 11 months ago
1995
ACM
Data mining or knowledge discovery in databasesis the search for relationships and global patterns that exist but are hidden in large databases.Many different methodshave been pro...
WWW
2005
ACM
14 years 8 months ago
2005
ACM
Web pages contain a combination of unique content and template material, which is present across multiple pages and used primarily for formatting, navigation, and branding. We stu...
HT
2009
ACM
14 years 2 months ago
2009
ACM
Data created by social bookmarking systems can be described as 3-partite 3-uniform hypergraphs connecting documents, users, and tags (tagging networks), such that the toolbox of c...
ICDE
2007
IEEE
14 years 9 months ago
2007
IEEE
Skyline query has been gaining much interest in database research communities in recent years. Most existing studies focus mainly on centralized systems, and resolving the problem...