This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...
—The research community and the IT industry have invested significant effort in fighting spam emails. There are many different approaches, ranging from white listing, black listi...
In this article we report on our efforts to test and expand the current state-of-the-art in eigenvalue solvers applied to the field of nanotechnology. We singled out the nonlinea...
Stanimire Tomov, Julien Langou, Andrew Canning, Li...
Many basic computations can be done by means of iterative neighborhood-based calculations, including threshold, optimum, distance transform, contour closing, mathematical morpholo...
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...