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» Selecting long atomic traces for high coverage
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CGO
2007
IEEE
13 years 11 months ago
Shadow Profiling: Hiding Instrumentation Costs with Parallelism
In profiling, a tradeoff exists between information and overhead. For example, hardware-sampling profilers incur negligible overhead, but the information they collect is consequen...
Tipp Moseley, Alex Shye, Vijay Janapa Reddi, Dirk ...
MOBISYS
2009
ACM
14 years 8 months ago
Blue-Fi: enhancing Wi-Fi performance using bluetooth signals
Mobile devices are increasingly equipped with multiple network interfaces with complementary characteristics. In particular, the Wi-Fi interface has high throughput and transfer p...
Ganesh Ananthanarayanan, Ion Stoica
SIGCOMM
2006
ACM
14 years 1 months ago
Minimizing churn in distributed systems
A pervasive requirement of distributed systems is to deal with churn — change in the set of participating nodes due to joins, graceful leaves, and failures. A high churn rate ca...
Brighten Godfrey, Scott Shenker, Ion Stoica
CN
2007
141views more  CN 2007»
13 years 7 months ago
Identifying lossy links in wired/wireless networks by exploiting sparse characteristics
In this paper, we consider the problem of estimating link loss rates based on end-to-end path loss rates in order to identify lossy links on the network. We first derive a maximu...
Hyuk Lim, Jennifer C. Hou
PVLDB
2008
124views more  PVLDB 2008»
13 years 6 months ago
Google's Deep Web crawl
The Deep Web, i.e., content hidden behind HTML forms, has long been acknowledged as a significant gap in search engine coverage. Since it represents a large portion of the structu...
Jayant Madhavan, David Ko, Lucja Kot, Vignesh Gana...