376 search results - page 32 / 76 » Self-Assembled Circuit Patterns |
ICCAD
1992
IEEE
13 years 11 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper discusses interconnect capacitance extraction for system LCD circuits, where coupling capacitance is much significant since a ground plane locates far away unlike LSI ...