1287 search results - page 120 / 258 » Self-Normalized Linear Tests |
ICPR
2004
IEEE
14 years 10 months ago
2004
IEEE
A robust modelling method for detecting and measuring isotropic, linear features and bifurcations is described and applied to analysing 2d eletrophoresis and retinal images. Featu...
ICCD
2002
IEEE
14 years 6 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
ICCV
1999
IEEE
14 years 1 months ago
1999
IEEE
We investigate the use of linear and nonlinear principal manifolds for learning low-dimensional representations for visual recognition. Three techniques: Principal Component Analy...